Fault-ToleranceinVHDLDescriptionTransient-FaultInjection在VHDL描述的瞬时故障注入容错

Fault-ToleranceinVHDLDescriptionTransient-FaultInjection在VHDL描述的瞬时故障注入容错

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1、Fault-ToleranceinVHDLDescription: Transient-FaultInjection& EarlyReliabilityEstimationTIMA-INPGLabFabianVargas,AlexandreAmoryRaoulVelazcovargas@computer.orgRaoul.Velazco@imag.frCatholicUniversity–PUCRSTIMA-INPGLaboratoryElectricalEngineeringDept.46,Av.FélixViallet Av.Ipiranga,668138031–Grenoble9

2、0619-900PortoAlegreFranceBrazilSummary1.Motivation:ImportantissuesonthedesignofFTcircuitsforspaceapplications2.1.TheProposedApproach:Built-InReliabilityFunctionsLibraryTargetArchitecture:mainblocks2.2.ReliabilityEarly-Estimation:Mainstepsoftheprocedureandfault-coverageestimationFault-InjectionMe

3、chanism:LFSRtoinjectsingle/multiplefaultsExampleoffaultinjectionintheVHDL:GenerateStatement3.Conclusions&FutureWork2vargas@computer.org1.Motivation:Importantconcernsofcomputerdesignersforspaceapplications:Powercomputation,areausage,weight,anddependability(availability,reliability,andtestability)

4、.MainCharacteristics&Drawbacks:application-specificsystems(requirementschangefrequentlyfromapplicationtoapplication):veryexpensivesystems!Synthesis(EDA)toolsdonotrepresenteffectivedevelopmentfacilitiestheshorttimeavailableformakingremedicalchangestoafaultyapplicationintime-criticalsystemsisnot

5、oftenrespected.notoptimizedcompilers.Thereisalackofcommerciallibrarieswithspecialcomponents(incorporatingFTfacilities)DevelopmentofanFPGA/ASICboardtotest/validatetheFTstrategies:takestimeandmoney!3vargas@computer.org1.Motivation:Fig.1.Illustrationofthechargecollectionmechanismthatcausessingle-

6、eventupset:(a)particlestrikeandchargegeneration;(b)currentpulseshapegeneratedinthen+pjunctionduringthecollectionofthecharge.RadiationcausesSingle-EventUpset(SEU)inmemoryelements:Processorlatchesandcachemem.cellsaresensitivetoSEUsFPGAsstorelogic/routinginlatches.4vargas@computer.org2.1.TheProp

7、osedApproach:Built-InReliabilityFunctionsLibrary:achievingthedesiredcircuitfault-toleranceFig.2.BlockdiagramoftheFT-PROtoolbeingdevelopedtoautomatetheprocessofgeneratingstorageelementtransient-fault-tolerantcomplexcircuits.5

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