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ID:41299094
大小:380.31 KB
页数:17页
时间:2019-08-21
《Fault-ToleranceinVHDLDescriptionTransient-FaultInjection在VHDL描述的瞬时故障注入容错》由会员上传分享,免费在线阅读,更多相关内容在教育资源-天天文库。
1、Fault-ToleranceinVHDLDescription:Transient-FaultInjection&EarlyReliabilityEstimationTIMA-INPGLabFabianVargas,AlexandreAmoryRaoulVelazcovargas@computer.orgRaoul.Velazco@imag.frCatholicUniversity–PUCRSTIMA-INPGLaboratoryElectricalEngineeringDept.46,Av.FélixVialletAv.Ipiranga,668138031–Grenoble9
2、0619-900PortoAlegreFranceBrazilSummary1.Motivation:ImportantissuesonthedesignofFTcircuitsforspaceapplications2.1.TheProposedApproach:Built-InReliabilityFunctionsLibraryTargetArchitecture:mainblocks2.2.ReliabilityEarly-Estimation:Mainstepsoftheprocedureandfault-coverageestimationFault-InjectionMe
3、chanism:LFSRtoinjectsingle/multiplefaultsExampleoffaultinjectionintheVHDL:GenerateStatement3.Conclusions&FutureWork2vargas@computer.org1.Motivation:Importantconcernsofcomputerdesignersforspaceapplications:Powercomputation,areausage,weight,anddependability(availability,reliability,andtestability)
4、.MainCharacteristics&Drawbacks:application-specificsystems(requirementschangefrequentlyfromapplicationtoapplication):veryexpensivesystems!Synthesis(EDA)toolsdonotrepresenteffectivedevelopmentfacilitiestheshorttimeavailableformakingremedicalchangestoafaultyapplicationintime-criticalsystemsisnot
5、oftenrespected.notoptimizedcompilers.Thereisalackofcommerciallibrarieswithspecialcomponents(incorporatingFTfacilities)DevelopmentofanFPGA/ASICboardtotest/validatetheFTstrategies:takestimeandmoney!3vargas@computer.org1.Motivation:Fig.1.Illustrationofthechargecollectionmechanismthatcausessingle-
6、eventupset:(a)particlestrikeandchargegeneration;(b)currentpulseshapegeneratedinthen+pjunctionduringthecollectionofthecharge.RadiationcausesSingle-EventUpset(SEU)inmemoryelements:Processorlatchesandcachemem.cellsaresensitivetoSEUsFPGAsstorelogic/routinginlatches.4vargas@computer.org2.1.TheProp
7、osedApproach:Built-InReliabilityFunctionsLibrary:achievingthedesiredcircuitfault-toleranceFig.2.BlockdiagramoftheFT-PROtoolbeingdevelopedtoautomatetheprocessofgeneratingstorageelementtransient-fault-tolerantcomplexcircuits.5
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