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1、AnalogandMixed-SignalBe:nchmarkCircuits-FirstReleaseB.Kaminska',K.Arabi',I.Bell2,P.Goteti3,J.L.Huertas4,B.Kim',A.Rueda4,andM.Soma3Opmaxx,Inc.,U.ofHull,U.of'Washington,CNM,Seville,TuftsUniv.forTTTCMixed-SignalTestingTechnicalActivityCommitteeAbstract-Th
2、eIEEEMixed-SignalTechnicalActivityCommitteeaudioandvideocapabilitiesinabroadrangeofproductshasisdevelopingacommonsetofbenchmarkcircuitsforuseincompelledthedesigncommunitytopackbothanalogandresearchingandevaluatinganalogfaultmodeling,testgeneration,digi
3、talfunctionalityonasinglechiptostaycompetitiveindesign-for-test,andbuilt-inselj-testmethodologies.Thefirmcostandperformance.releasecircuitsarebasedonMITELSemiconductor's1.Spmand'Advancesindeepsubmicrontechnologieshavefueled1.2pmCMOStechnologiesandtheyw
4、illallowengineersand'theexplosiveincreaseinICcomplexity,butsmallergateresearchersworkinginanalogandmixed-signaltestingtocom-lengthsmakethesechipsmuchmoresensitivetofabricationparetestresultsasisdoneinthedigitaldomain.Thispaperpre-variationsandtolerance
5、accumulations.ThisisespeciallysentsasetoftypicalcircuitsdescribedbynetlistsinHSPICEtrueformixed-signaldesigns,withtheirprocess-sensitiveformat.Schematicdiagrams,simulationresu1t.randmeasured'analogcircuitry.Consequently,ICsareincreasinglynotresults,ifa
6、vailable,areprovidedtogetherwithlajoutandatypicalmeetingspecifications.Althoughthereisagrowingneedfortestenvironment.Thefulldetailsareavailableonthewebpagetighterqualitycontrols,highergatecountsmaketheseICsdedicatedtoanalogandmixed-signalbenchmark.diff
7、iculttosimulate,analyzeandtestinareasonabletime.IncompletesimulationandtestingdirectlyleadstoanI.INTRODUCTIONincreaseinfieldreturns-asituationanyICdesignerwantsTwotrendsintheelectronicindustryhavedramaticallytoavoidatallcosts.boostedtheimportanceofanal
8、ogcircuitry,movingitmoreToimprovetestingcapabilities,theMixed-SignalTestingintomainstreamICdesign.First,asgatelengthscontinuetoCommitteehasconcentratedonprovidinganalogandmixed-shrnnkwithdeepsubmicrondimensions,systemdesignerswanttopack