石墨烯形貌&物相

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1、Thecharacterizationofgrephene班级：09级材料三班组员：朱杉（编辑校稿）张强（文章撰写）高厚仁（资料收集）陈宏翔（文章撰写）开赛尔江（其他）石墨烯的表征方法1IntroductionGrapheneatwo-dimensional,single-layersheetofsp2-hybridizedcarbonatoms,hasattractedtremendousattentionandresearchinterest,owingtoitsexceptionalphysicalpropertie

2、s.1.1SynthesisofgrapheneMechanicalexfoliationChemicalvapordeposition(CVD)ChemicallyderivedgrapheneOthersynthesisapproaches1.2PropertiesandcharacterizationHighelectronicconductivityGoodthermalstabilityExcellentmechanicalstrength2MorphologyanalysisAtomForceMicroscop

3、e（AFM）ScanningTunnelMicroscope（STM）ScanningElectronMicroscope（SEM）OpticalMicroscope（OM）2.1AFMPreparationObservationPerformancetestFig1.SEMimagesofearlyattemptsatmechanicalexfoliationusinggraphitepillarsFig2.3DmodelofAFMtip/specimencontactFig3.Mechanicalexfoliation

4、producedtheveryfirstsinglelayergrapheneflakes.Fig4.(a)8μmx8μmAFMtopography(b)Pseudo-3DrepresentationFig5.SchematicofAFMtip/specimencontactundernegativeandpositiveappliedloads.Fig6.Fig7.AFMimageofthegraphenespecimen,2Dprofilesatthesixdifferentregionsandthethickness

5、atthesixsitesindicatedontheimageFig8.AFMimagesofgraphenespecimen(a)beforeand(b)afterweartest.Fig9.(a)AFMimageofweartracksand(b)thecross-sectionsofweartracks.2MorphologyanalysisAtomForceMicroscope（AFM）ScanningTunnelMicroscope（STM）ScanningElectronMicroscope（SEM）Opti

6、calMicroscope（OM）2.2STMFig10.(a)STMimageofgraphiteshowingonlythethreecarbonsthateclipseaneighborinthesheetdirectlybelow.(b)Incontrast,allsixcarbonsareequivalentandthusvisibleinmechanicallyexfoliatedsingle-layergraphene.2MorphologyanalysisAtomForceMicroscope（AFM）Sc

7、anningTunnelMicroscope（STM）ScanningElectronMicroscope（SEM）OpticalMicroscope（OM）Fig11.Graphenenanofabric.SEMmicrographofastronglycrumpledgraphenesheetonaSiwafer.Notethatitlooksjustlikesilkthrownoverasurface.Lateralsizeoftheimageis20microns.Siwaferisatthebottom-righ

8、tcorner.2.3SEMFig12.(a)(b)SEMimageofgraphene1MorphologyanalysisAtomForceMicroscope（AFM）ScanningTunnelMicroscope（STM）ScanningElectronMicroscope（SEM）Optic