electronics for the lhcb outer tracking detector

electronics for the lhcb outer tracking detector

ID:25203066

大小:6.27 MB

页数:31页

时间:2018-11-18

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1、ElectronicsfortheLHCbOuterTrackingDetectorDirkWiednerPhysicsInstituteUniversityofHeidelbergGermanyLHCbTracking:ImpactmeasurementCERNSwitzerlandOuterTrackerIonisingparticle200μmresolutionElectronicsPlacementOTISGOLASDBLROTISHVboardsASDBLRASDBLRLVRegL1TFCECSLVHVFrontend

2、box:128channels16ASDBLRamplifiers4OTISTDCchips1opticallink:1.6Gbit/sOuterTracker:3Stations56000channels432FEboxes=432opticallinksTFCTFCECSECSPower(HV,LV)Power(HV,LV)TFCTFCECSECSPower(HV,LV)Power(HV,LV)FiberstoL1BufferFiberstoL1BufferFiberstoL1BufferFiberstoL1Buffertot

3、.dose<10kradElectronicsSchemeASDOTIS-TDCL0Buffer0-Supp.thresholdFastControl200fCDAQ(PCs)countingroom~100mFEElectronicsonthedetectorGOLElectronicsServiceBoxPower/ControlAmplifierTDCopticallinkElectronicComponentsin FE-BoxGOLASDASDASDASDHV-BoardHV-BoardTDCTDCGOL:Gigabit

4、OpticalLinkOTIS:OuterTrackerTimeInformationSystemASD:AmplifierShaperDiscriminatorHV:HighVoltagex1x4x8x4432FE-BoxesHV-BoardsCapacitors:JOHANSON302R29W331KV4EMax.Volt.:4kVSize:4.6x2x1.5mm3R=1MΩC=330pFZ=316Ω32channels/boardCompactcapacitorsOperationinaircasting/embedding

5、ofcapsCastingembeddingTechnologySeveretechnologicalproblemsinthebeginning:ImperfectsolderingprocedureHandre-workMechanicalstressanddamageofcapsMeanwhile(severaliterations)technologyiswellunderstoodProductionTesting56HVboardsV5*:testedfor48h@70oC,2500V2failingcap(Ileak

6、>100A)6moreboardsdiscardedAllothercaps:<1nA/capSatisfyingresult*)allchannelscarefullymonitoredduringtheproductionYieldof80%expected,85%yieldreachedalreadyASDBoardTDCHVBoardAmplifierShaperDiscriminatorwithBaseLineRestoration~10nsshapingtime1fCsensitivity8channelsDesig

7、nedforATLASdetectorTotalneedof7200chips28896chipsavailableGroundspringsASDBLRTestingChipscategorized:pre-selection:currentconsumptionbrokenchannelsetc.→62.2%acceptedperformance:thresholdspreadchecked→32%bestchipschosenHalfEfficiencyVthr[50%]Eff0.5OTISTDC32channelASICT

8、DC1nsdrifttimeresolution75nsmax.drifttimesingleandmulti-hitradiationtolerantonchipL0buffer2000TDCsneededOTISWaferTest47wafer

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