手机硬件测试流程

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1、硬件测试用例TITLE硬件测试用例DOCUMENTIDAUTHORLASTMODIFIEDNUMBEROFPAGESCREATIONDATEVERSIONSTATUSVOBIDDISTRIBUTETOCopyrightÓ2004LesmoMobileCommunicationsAllRightsReservedLesmoMobileCommunicationsConfidentialProprietaryDOCUMENTID-VERSIONDATERevisionHistoryRevisionAut

2、horReviewedA.DescriptionOfChangeIssuedby#ByB.SummaryofReview/DateV1.0JYChen2005.1.21V1.1JYChen增加电流测试项，完善测试方法2005.8.1保密声明本文档（包括任何附件）包含的信息是保密信息。接收人了解其获得的本文档是保密的，除用于规定的目的外不得用于任何目的，也不得将本文档泄露给任何第三方。DOCUMENTID-VERSIONDATETableofContents1.RF测试................

3、...........................................................................................................................31.1POWER_VS_TIME_TEMPLATE............................................................................................41.2POWER_V

4、S_CHANNEL.......................................................................................................41.3FREQUENCY/PHASE_ERROR............................................................................................51.4OUTPUT_RF_SPECTRUM.

5、........................................................................................................51.5RX_LEVEL................................................................................................................................71.6RX_S

6、ENSITIVITY.......................................................................................................................71.7同信道抑制..................................................................................................................

7、............71.8邻信道抑制..............................................................................................................................71.9互调抑制.................................................................................................

8、.................................81.10阻塞与杂散响应...................................................................................................................81.11天线测试...................................................................