欧司朗-高功率LED Reliability.pdf

欧司朗-高功率LED Reliability.pdf

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时间:2020-03-15

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1、ReliabilityoftheDRAGONProductFamilyApplicationNoteIntroductionThisapplicationnoteprovidesanoverviewoftheperformanceoftheDRAGONproductfamily(inthiscase,LEDswithoutplasticlenses)aswellasasummaryofthemostimportantcustomer-relevantLEDdatawithrespecttoitseffectonLEDlifetime.Ingeneral,itshould

2、benotedthatinspiteofthehighreliabilityofLEDs,ahightotalorsystemreliabilitycanonlybeachievedifallfactorsandparametersaretakenintoconsideration(seeApplicationNotemeansoflead-freeIRreflowsoldering"ReliabilityandLifetimeofLEDs").techniques.ApossibleinfluenceonthereliabilityoftheAswithallothe

3、rLEDsfromOSRAMOptoLEDbytheuserisessentiallyspecifiedbySemiconductors,theDRAGONproductlinethechosenoperatingconditions,byalsofulfillscurrentRoHSguidelinesandconsiderationoftheprocessingdetails,andcontainsnoleadorotherhazardousforhighpowerLEDssuchastheDRAGONsubstances.productfamily,forexam

4、ple,bytheprovisionofadequatethermalmanagement.ConstructionandagingDRAGONproductfamilymechanismsofDRAGONLEDsTheDRAGONproductfamilywasprimarilyTheconstructionoftheDRAGONproductdevelopedforapplicationswhichrequirefamilyisbasedonathermally-optimizedmaximumlightcombinedwithlowspacepackagedesi

5、gn,consistingofaprefabri-requirementsandthehighestdemandsoncatedplasticpackagewithanintegratedlifetime.heatsinkandconnectioncontactsDuetotheirperformanceanddesign,(Figure1).DRAGONLEDsaresuitablefordiverseareasoflightingandilluminationtechnology,Anadvantageofthisdesignisthatitpermitsrangi

6、ngfromgenerallightingtoautomotivemutualexchangeabilitywithintheproductapplicationsandthereplacementoffamily,thusincreasingcustomerflexibilityminiatureincandescentlamps.duetoidenticalsolderpadlayouts.Designedforhigh-volumeproduction,theyAprimaryfactorwhichinfluencesthelifetimecanbeprocess

7、edwithallestablishedofanLEDisthetemperatureofthelight-populatingtechniquesandmountedbyemittinglayerorjunctiontemperature(Tj)withwhichtheLEDisdrivenintheapplication.May,2011Page1of13Figure1:DRAGONbasicpackage–thermallyoptimizedWithalowerjunctiontemperature,theexpectedlifet

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