Scanning-Probe-Microscopy-扫描探针显微镜.ppt

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1、ScanningProbeMicroscopyMembers:XiaoyuZhaoChenjiaoBaiFanfanLianQiaoliXuJunLiuYaoXuJunHuOutlineBackgroundandHistoryAFMMFMSNOMEFMSTMSHFMBackgroundFirstscanningprobemicroscopeinventedin1981byBinningandRoherWiderangeofapplicationsTopography/AtomicStructureMagnetic/

2、ElectricfieldsSurfacetemperaturesAtomicForceMicroscopy(AFM)MostwidelyusedbranchofscanningprobemicroscopyOperatesbymeasuringtheinteractionforcebetweenthetipandsampleAFMOperationModesContactModeTipremainsintherepulsiveregimeoftheinter-molecularforcecurveTappingM

3、odeTipisoscillatedatahighfrequencyDeflectionsintheoscillationsareobservedNon-ContactModeTipisoscillatedoutsideoftherepulsiveregimeMagneticForceMicroscopy(MFM)CoatedwithamagneticcoveringTwomodesofoperationNon-vibratingforlargermagneticfieldsVibratingforweakerfi

4、eldsthatrequireagreatersensitivityElectrostaticForceMicroscopy(EFM)AbiasisusedtocreateanelectrostaticfieldbetweenthetipoftheprobeandthesampleTwousesDeterminewhichregionsareconductingandwhichareinsulatingDeterminetheelectricpotentialatdifferentpointsScanningTun

5、nelingMicroscopy(STM)ElectronsaretransferredbetweenthetipandthesampleduetooverlappingorbitalsAnettransfercanbesustainedbyapplyingavoltageacrossthegapChangeincurrentisaresultofachangeinthetip-sampleseparationShearForceMicroscopy(ShFM)Probeoscillatesparalleltoth

6、especimenAdvantagesMorerigidsetup“Jumptocontact”problemisalmosteliminatedDisadvantagesCanbeverydifficulttosetupProbetipisveryhardtoreproducereliablyScanningNearFieldOpticalMicroscopy(SNOM)TypicalopticalmicroscopesLimitedbytheAbbediffractionbarrierResolutionequ

7、altoonehalfofthewavelengthofthelightThankyou!