ctl-op 111 ed20

ctl-op 111 ed20

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时间:2018-07-12

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1、IECEECTL-OP111Ed.2.0COMMITTEEOFTESTINGLABORATORIESOPERATIONALPROCEDURERequirementsfortraceabilityofCalibrationsandCalibrationIntervalsExceptforIECEEmembersandmandatedpersons,nopartofthispublicationmaybereproducedorutilizedinanyformorbyanymeans,electronicormechanical,includingphotocopyingandmicr

2、ofilm,withoutpermissioninwritingfromthepublisherIECEESecretariat,3,ruedeVarembé,Geneva,Switzerland,Telefax:+41229190300,e-mail:pro@iec.chCTL-OP111Ed.2.0©IEC–IECEE20112011-09-22OD-XXXXEdX.X4/4©IEC–IECEE20112011-01-01IECSystemforConformityTestingandCertificationofElectrotechnicalequipmentandCompo

3、nentsContentsBackground2Purpose31Scope32Definitions33Responsibilityofthelaboratory34ApplicableDocuments35General36Requirements3BackgroundCTL-OP111Ed.2hasbeenpublishedonlybyissuingthenewformatofCTL-OPs.Thecontenthasnotbeenchanged.Thishasbeenapprovedbythe48thCTLMeetingheldinGenevaon2011-09-21/22.

4、CTL-OP111Ed2.05/5©IEC–IECEE20112011-09-22IECSystemforConformityTestingandCertificationofElectrotechnicalequipmentandComponentsPurposeThepurposeofthisdocumentistoestablishuniformrequirementsfortraceabilityofcalibrationsandcalibrationintervalstoensureconsistentandrepeatabletestresults.1ScopeThere

5、quirementscontainedinthisdocumentapplytolaboratoryequipmentrequiredtobecalibratedundertherequirementsofISO/IEC17025.2DefinitionsDefinitionsuniquetotheserequirements-None3ResponsibilityofthelaboratoryThelaboratoryshallhaveproceduresinplacetoensurethattherequirementsfortraceabilityofcalibrationsa

6、ndcalibrationintervalsaremet.4ApplicableDocumentsISO/IEC17025Generalrequirementsforthecompetenceoftestingandcalibrationlaboratories5GeneralRequirementsgiveninthisdocumentaretobefollowedtoensuretestconsistencyandrepeatability.6Requirements6.1TraceabilityofCalibrations6.1.1Calibrationsshallberega

7、rdedasbeingtraceableifthecalibrationsaredonebyfollowingtherequirementsofISO/IEC17025,Generalrequirementsforthecompetenceoftestingandcalibrationlaboratories,andbyoneofthefollowing:a)TheinstrumentwascalibratedbyaNationalMetrologyIns

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