单片机英文文献及翻译)

单片机英文文献及翻译)

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时间:2018-09-16

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1、ValidationandTestingofDesignHardeningforSingleEventEffectsUsingthe8051MicrocontrollerAbstractWiththedearthofdedicatedradiationhardenedfoundries,newandnoveltechniquesarebeingdevelopedforhardeningdesignsusingnon-dedicatedfoundryservices.Inthispaper,wewilldiscusstheimplicationsofvalidatingt

2、hesemethodsforthesingleeventeffects(SEE)inthespaceenvironment.Topicsincludethetypesofteststhatarerequiredandthedesigncoverage(i.e.,designlibraries:dotheyneedvalidatingforeachapplication?).Finally,an8051microcontrollercorefromNASAInstituteofAdvancedMicroelectronics(IAμE)CMOSUltraLowPowerR

3、adiationTolerant(CULPRiT)designisevaluatedforSEEmitigativetechniquesagainsttwocommercial8051devices.IndexTermsSingleEventEffects,Hardened-By-Design,microcontroller,radiationeffects.I.INTRODUCTIONNASAconstantlystrivestoprovidethebestcaptureofsciencewhileoperatinginaspaceradiationenvironme

4、ntusingaminimumofresources[1,2].Witharelativelylimitedselectionofradiation-hardenedmicroelectronicdevicesthatareoftentwoormoregenerationsofperformancebehindcommercialstate-ofthe-arttechnologies,NASA’sperformanceofthistaskisquitechallenging.Onemethodofalleviatingthisisbytheuseofcommercial

5、foundryalternativeswithnoorminimallyinvasivedesigntechniquesforhardening.Thisisoftencalledhardened-by-design(HBD).Buildingcustom-typeHBDdevicesusingdesignlibrariesandautomateddesigntoolsmayprovideNASAthesolutionitneedstomeetstringentscienceperformancespecificationsinatimely,cost-effectiv

6、e,andreliablemanner.However,onequestionstillexists:traditionalradiation-hardeneddeviceshavelotand/orwaferradiationqualificationtestsperformed;whattypesoftestsarerequiredforHBDvalidation?II.TESTINGHBDDEVICESCONSIDERATIONSTestmethodologiesintheUnitedStatesexisttoqualifyindividualdevicesthr

7、oughstandardsandorganizationssuchasASTM,JEDEC,andMIL-STD-883.Typically,TID(Co-60)andSEE(heavyionand/orproton)arerequiredfordevicevalidation.SowhatisuniquetoHBDdevices?Asopposedtoa“regular”commercial-off-the-shelf(COTS)deviceorapplicationspecificintegratedcircuit(ASIC)wher

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