单片机英文文献及翻译)new

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1、ValidationandTestingofDesignHardeningforSingleEventEffectsUsingthe8051MicrocontrollerAbstractWiththedearthofdedicatedradiationhardenedfoundries,newandnoveltechniquesarebeingdevelopedforhardeningdesignsusingnon-dedicatedfoundryservices.Inthispaper,wewilldiscussthe

2、implicationsofvalidatingthesemethodsforthesingleeventeffects(SEE)inthespaceenvironment.Topicsincludethetypesofteststhatarerequiredandthedesigncoverage(i.e.,designlibraries:dotheyneedvalidatingforeachapplication?).Finally,an8051microcontrollercorefromNASAInstitute

3、ofAdvancedMicroelectronics(IAμE)CMOSUltraLowPowerRadiationTolerant(CULPRiT)designisevaluatedforSEEmitigativetechniquesagainsttwocommercial8051devices.IndexTermsSingleEventEffects,Hardened-By-Design,microcontroller,radiationeffects.I.INTRODUCTIONNASAconstantlystri

4、vestoprovidethebestcaptureofsciencewhileoperatinginaspaceradiationenvironmentusingaminimumofresources[1,2].Witharelativelylimitedselectionofradiation-hardenedmicroelectronicdevicesthatareoftentwoormoregenerationsofperformancebehindcommercialstate-ofthe-arttechnol

5、ogies,NASA’sperformanceofthistaskisquitechallenging.Onemethodofalleviatingthisisbytheuseofcommercialfoundryalternativeswithnoorminimallyinvasivedesigntechniquesforhardening.Thisisoftencalledhardened-by-design(HBD).Buildingcustom-typeHBDdevicesusingdesignlibraries

6、andautomateddesigntoolsmayprovideNASAthesolutionitneedstomeetstringentscienceperformancespecificationsinatimely,cost-effective,andreliablemanner.However,onequestionstillexists:traditionalradiation-hardeneddeviceshavelotand/orwaferradiationqualificationtestsperfor

7、med;whattypesoftestsarerequiredforHBDvalidation?II.TESTINGHBDDEVICESCONSIDERATIONSTestmethodologiesintheUnitedStatesexisttoqualifyindividualdevicesthroughstandardsandorganizationssuchasASTM,JEDEC,andMIL-STD-883.Typically,TID(Co-60)andSEE(heavyionand/orproton)arer

8、equiredfordevicevalidation.SowhatisuniquetoHBDdevices?Asopposedtoa“regular”commercial-off-the-shelf(COTS)deviceorapplicationspecificintegratedcircuit(ASIC)wher