Swarup Bhunia, Saibal Mukhopadhyay - Low-Power Variation-Tolerant Design in Nanometer Silicon

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1、Low-PowerVariation-TolerantDesigninNanometerSiliconSwarupBhunia·SaibalMukhopadhyayEditorsLow-PowerVariation-TolerantDesigninNanometerSilicon123EditorsSwarupBhuniaSaibalMukhopadhyayDepartmentofElectricalEngineeringSchoolofElectricalandandComputerScienceCompu

2、terEngineeringCaseWesternReserveUniversityGeorgiaInstituteofTechnologyCleveland,OH44106-7071,USAAtlanta,GA30332-0250,USAskb21@case.edusaibal@ece.gatech.eduISBN978-1-4419-7417-4e-ISBN978-1-4419-7418-1DOI10.1007/978-1-4419-7418-1SpringerNewYorkDordrechtHeidel

3、bergLondonLibraryofCongressControlNumber:2010938792©SpringerScience+BusinessMedia,LLC2011Allrightsreserved.Thisworkmaynotbetranslatedorcopiedinwholeorinpartwithoutthewrittenpermissionofthepublisher(SpringerScience+BusinessMedia,LLC,233SpringStreet,NewYork,N

4、Y10013,USA),exceptforbriefexcerptsinconnectionwithreviewsorscholarlyanalysis.Useinconnectionwithanyformofinformationstorageandretrieval,electronicadaptation,computersoftware,orbysimilarordissimilarmethodologynowknownorhereafterdevelopedisforbidden.Theuseint

5、hispublicationoftradenames,trademarks,servicemarks,andsimilarterms,eveniftheyarenotidentifiedassuch,isnottobetakenasanexpressionofopinionastowhetherornottheyaresubjecttoproprietaryrights.Printedonacid-freepaperSpringerispartofSpringerScience+BusinessMedia(ww

6、w.springer.com)PrefaceTheenergyrequiredforrunningintegratedcircuits(ICs)isincreasingineverynewgenerationofelectronicsystems.AtthesametimethemanufacturingprocessusedtobuildtheseICsarebecominglessdeterministic.Hence,low-powerdesignunderlargeparametervariation

7、shasemergedasanimportantchallengeinthenanometerregime.Thebook,forthefirsttime,integratesdescriptionoflowpowerandvaria-tionissuesandprovidesdesignsolutionstosimultaneouslyachievelowpowerandrobustoperationundervariations.Designconsiderationsforlowpowerandrobus

8、tnesswithrespecttovariationstypicallyimposecontradictoryrequirements.Powerreductiontechniquessuchasvoltagescaling,dual-thresholdassignmentandgatesizingcanhavelargenega-tiveimpactonparametricyieldunderp