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1、CORE-UNIFIEDSOCTESTDATACOMPRESSIONANDAPPLICATION1WangWei*ZhangLei*YiMaoxiangGuoXueyingLiangHuaguo(DepartmentofElectronicScienceandTechnology,HefeiUniversityofTechnology,Hefei230009,China)*(SchoolofComputerandInformation,HefeiUniversityofTechnology,Hefei2300
2、09,China)AbstractThepatternrun-lengthcodingtestdatacompressionapproachisextendedbyintroducingdon’tcarebit(x)propagationstrategyintoit.Morethanonecoretestsetsfortestingcore-basedSystem-on-Chip(SoC)areunifiedintoasingleone,whichiscompressedbytheextendedcoding
3、technique.Areconfigurablescantestapplicationmechanismispresented,inwhichtestdataformul-tiplecoresarescannedandcapturedjointlytomakeSoCtestapplicationmoreefficientwithlowhardwareoverheadadded.TheproposeduniontesttechniqueisappliedtoanacademicSoCembeddedbysix
4、largeISCAS’89benchmarks,andtoanITC’02benchmarkcircuit.Experimentresultsshowthatcomparedwiththeexistingschemesinwhichacoretestsetiscompressedandappliedindependentlyofothercores,theproposedschemecannotonlyimprovetestdatacompression/decompression,butalsoreduce
5、theredundantshiftandcapturecyclesduringscantesting,decreasingSoCtestapplicationtimeeffectively.System-on-Chip(SoC);Testapplicationtime;Patternrun-length;X-propagation;KeywordsUniontest;ReconfigurationCLCindexTN407DOI10.1007/s11767-008-0131-7I.IntroductionEv
6、en-growingcorecomplexityandtestdatavolumeposessignificantchallengestotestingthecore-basedSystem-on-Chip(SoC).TestResourcePartition(TRP)techniquecanimproveSoCtestefficiency[1],inwhichthetestdataarecompressedandtransferredbyexternaltestertochipundertestwheret
7、heyaredecodedandappliedtoCircuitUnderTest(CUT).VariousTestDataCompressionstopsrunning.Ontheotherhand,varioustestapplicationtechniques[7–12]havealsobeenproposed,amongwhichRefs.[9,10]presentedcorewrapperreconfigurationtechniquestoincreasetheflexibil-ityoftest
8、scheduling.Moreover,Refs.[11]and[12]wrapmultiplecoresintoasinglewrapper.Unfor-tunately,thescanelementsofdifferentcoresbeingarbitrarilyassigned,highareaoverheadisintro-ducedforreconfigurationandwiring.I
